1. Common functions of ICT:

1. ICT can fully detect the components on the assembled circuit board in just a few seconds: resistors, capacitors, inductors, transistors, FETs, LEDs, ordinary diodes, stabilized diodes, photocouplers, ICs Whether other parts are operating within the specifications we designed.
2. ICT can find out the defects of the process in advance, such as short circuit, open circuit, component missing parts, reverse, wrong parts, empty welding and other bad problems, and feed back to the improvement of the process.
3. ICT can use the printer to print out the test results of the above faults or bad information, including the fault location, standard values of parts, and test values, for the reference of maintenance personnel. It can effectively reduce the personnel's dependence on product technology, without the need to understand the product line, and still have the ability to maintain.
4. Ability to analyze bad test information and analyze it by production management personnel to find out the causes of various kinds of defects, including human factors, so that they can be solved, perfected, and corrected to improve circuit board manufacturing and quality capabilities.
It is precisely because of the huge benefits brought to customers by the above functions of ICT that there is a reality that ICT has been widely used today!

2. Special ICT functions:
1. Electrolytic capacitor polarity test technology:
Reverse electrolytic capacitors, 100% measurable parts
The parallel electrolytic capacitor is reversed and the leakage parts are 100% measurable
The working principle of the electrolytic capacitor polarity test technology:
1.1ICT is to use a third pin to apply a trigger signal (Trigger Signal) to the top of the electrolytic capacitor, and measure the reaction signal between the third point and the positive or negative terminal
1.2 ICT is calculated by using DSP (Digital Signal Processing) technology and converted into a set of vectors (Vectors) through DFT (Discrete Fourier Transform, Discrete Fourier Transform) and FFT (Fast Fourier Transform). The measured response signal is converted from t (time) domain (oscilloscope signal) to a vector group of f (frequency) domain (spectrum analyzer signal).
1.3 Obtain a set of standard vector values through Learning, and then the values measured by the DUT (Device Under Test) (as shown in Figure 5) are then compared with the original standard values by Pattern Match To determine whether the polarity of the test object is correct.
Pattern Match applications such as fingerprint identification, counterfeit banknote identification, retina identification, etc. are all.